Make: Metricon (USA)
Model:2010-M
- Capabilities
Determination of the Refractive Index of bulk and thin film materials with high accuracy.
Determination of the thickness of thin film.
- Applications
To determine the refractive index of glass, crystal and thin films as well as the thickness of thin film.
- Charges
| User Type | Charges (INR) (+ applicable GST) |
|---|---|
| UG /PG Students from Academic Institutions | 500 |
| Research Scholar from Academic Institutions | 500 |
| Project Staff from Academic Institutions | 500 |
| Faculty Members from Academic Institutions | 500 |
| Research Scientist from R&D Organizations | 500 |
| Industry Personnel from Industry | 500 |
| Personnel from Non – Government Organizations | 500 |
- Location
Room no: 406
Technology Tower
Advanced Materials Research Lab
- Contact
Dr. D. Rajan Babu,
Professor (Higher Academic Grade)
Department of Physics,
School of Advanced Sciences,
VIT, Vellore-632 014
Email: sas.prismcoupler@vit.ac.in
Phone: 0416 2202397