Make:EverBeing Int'l
Model:C4HT / Keysight B2902B
- Capabilities
Probe Station:
- Make: EverBeing Int’l;
- Model: C4HT
- Micropositioners :4 probes with magnetic-lock-based
- Probe:Tungsten tips of 5µm diameter
- Temperatures: RT – 200°C(Heatable vacuum chuck)
- Optical microscope: Magnification: 150x;
- Camera: Moticam 8MP
Source Measurement Unit (SMU) –
- Model:Keysight B2902B
- Voltage range: ±210 V
- Current range:±3 A DC, ±10.5A pulsed
- Accuracy: 0.015%
- Source and measurement
- Resolution : 10 fA and 100 nV
- Applications
- DC Electrical Characterization
Measuring I–V, C–V, and resistance on wafers, dies, or packaged devices.
RF / High-Frequency Measurements
With RF probes, supports S-parameter, impedance, and signal Integrity tests.
Temperature-Dependent Testing
With hot chuck (up to ~200 °C), enables study of device behavior vs. temperature.
Low-Noise / Shielded Measurements
Optional shielding boxes allow probing of ultra-low Current/voltage devices.
- Charges
| S. No. | Experiment Details | UG /PG Students from Academic Institutions (in INR) | Research Scholar from Academic Institution (in INR) | Project Staff from Academic Institution (in INR) | Faculty Members from Academic Institutions (in INR) | Research Scientist from R&D Organizations (in INR) | Industry Personnel from Industry (in INR) |
|---|---|---|---|---|---|---|---|
| 1 | Probe Station with Source Meter Unit | 1000 | 1000 | 1000 | 1000 | 2000 | 2000 |
* Charges for per sample in INR (+ applicable GST)
- Location
Room No.: 402- Technology Tower,
Device Characterisation Laboratory
Centre for Functional Materials,
Vellore Institute of Technology (VIT), Vellore.
- Contact
Dr.AnKur Rastogi
402 Technology Tower
Device Characterisation Laboratory
Centre for Functional Materials (CFM),
Vellore Institute of Technology – Vellore Campus,
Thiruvalam Road, Vellore – 632 014, Tamil Nadu, India.
Office Phone: +91 – 416 – 220 2353
Instrument email ID: cfm.pssmu@vit.ac.in