Surface Profilometer

Home Facilities Surface Profilometer

Make: Bruker Dektak XT

Model: Bruker Dektak XT

Thickness measurement of thin film and thick films up to mm, Step height measurement, surface topography and waviness profile
Solar cells, Thin films, Sensors, Optics, Etching, Photoresist thickness

Room No.: 027
Ground Floor
Technology Tower
Nanotechnology Lab
Centre for Nanotechnology Research

Prof. George Jacob,
Assistant Professor (Sr.),
Centre for Nanotechnology Research,
VIT, Vellore, TN-632014.
Email: cnr.sp@vit.ac.in
Phone: 0416-2202412

Internal Users

EQUIPMENT_NAME UG /PG Students(in INR) Research Scholar (in INR) Faculty Members/ Project Staff (in INR)
Surface Profiliometer 200 200 200

External Users

EQUIPMENT_NAME UG /PG Students from Academic Institution (in INR) Research Scholar from Academic Institution (in INR) Project Staff from Academic Institution (in INR) Faculty Members from Academic Institution (in INR) esearch Scientist from R&D Organizations (in INR) ndustry Personnel from Industry (in INR) ersonnel from Non - Government Organization (in INR)
Surface Profiliometer 500 500 500 500 1000 1000 1000