Make: Bruker Dektak XT
Model: Bruker Dektak XT
Thickness measurement of thin film and thick films up to mm, Step height measurement, surface topography and waviness profile
Solar cells, Thin films, Sensors, Optics, Etching, Photoresist thickness
Room No.: 027
Ground Floor
Technology Tower
Nanotechnology Lab
Centre for Nanotechnology Research
Prof. George Jacob,
Assistant Professor (Sr.),
Centre for Nanotechnology Research,
VIT, Vellore, TN-632014.
Email: cnr.sp@vit.ac.in
Phone: 0416-2202412
Internal Users
| EQUIPMENT_NAME | UG /PG Students(in INR) | Research Scholar (in INR) | Faculty Members/ Project Staff (in INR) |
|---|---|---|---|
| Surface Profiliometer | 200 | 200 | 200 |
External Users
| EQUIPMENT_NAME | UG /PG Students from Academic Institution (in INR) | Research Scholar from Academic Institution (in INR) | Project Staff from Academic Institution (in INR) | Faculty Members from Academic Institution (in INR) | esearch Scientist from R&D Organizations (in INR) | ndustry Personnel from Industry (in INR) | ersonnel from Non - Government Organization (in INR) |
|---|---|---|---|---|---|---|---|
| Surface Profiliometer | 500 | 500 | 500 | 500 | 1000 | 1000 | 1000 |