Make: J.A. Woollam Co. Inc
Model: J.A Woollam alpha-SE (EID 1190083)
Optical constant analysis
- (n - real part of refractive index; i - imaginary part of refractive index)
- Oscillator model and parameter studies
Thickness measurements of films, Optical parameters, Roughness analysis.
Room No.:717
Seventh Floor
Technology Tower
MEMS and Chemical Sensors Lab
School of Electronics Engineering
Dr. Zachariah C Alex,
Sr. Professor,
Department of Sensor and Biomedical Technology,
School of Electronics Engineering (SENSE),
VIT, Vellore, TN-632014.
Email: sense.ellipso@vit.ac.in
Phone: 0416-2202809
| User Type | Spectroscopic Ellipsometer - Thickness & Roughness Measurement | Spectroscopic Ellipsometer - Optical Properties (n & k) |
|---|---|---|
| Charges (INR) (+ applicable GST) | Charges (INR) (+ applicable GST) | |
| UG /PG Students from Academic Institution | 500 | 1000 |
| Research Scholar from Academic Institution | 500 | 1000 |
| Project Staff from Academic Institution | 1000 | 2000 |
| Faculty Members from Academic Institution | 1000 | 2000 |
| Research Scientist from R&D Organizations | 1500 | 2500 |
| Industry Personnel from Industry | 2000 | 4000 |
| Personnel from Non - Government Organization | 2000 | 4000 |