Make: Metricon (USA)
Model: 2010-M
Determination of the Refractive Index of bulk and thin film materials with high accuracy.
Determination of the thickness of thin film.
To determine the refractive index of glass, crystal and thin films as well as the thickness of thin film.
Room no: 406
Technology Tower
Advanced Materials Research Lab
Dr. D. Rajan Babu,
Professor (Higher Academic Grade)
Department of Physics,
School of Advanced Sciences,
VIT, Vellore-632 014
Email: sas.prismcoupler@vit.ac.in
Phone: 0416 2202397
| User Type | Charges (INR) (+ applicable GST) |
|---|---|
| UG /PG Students from Academic Institutions | 500 |
| Research Scholar from Academic Institutions | 500 |
| Project Staff from Academic Institutions | 500 |
| Faculty Members from Academic Institutions | 500 |
| Research Scientist from R&D Organizations | 500 |
| Industry Personnel from Industry | 500 |
| Personnel from Non - Government Organizations | 500 |