Make: ULVAC-PHI
Model: VersaProbe 4
- Elemental Scan (Survey + HR)
- Depth Profiling
- Line Profiling
- Mapping
- Ultraviolet Photoelectron Spectroscopy (UPS)
- Low-Energy Inverse Photoemission Spectroscopy (LEIPS)
Also known as ESCA, it is used to find the surface level elemental composition of the solid samples and the oxidation states of elements present. It can also be used to find the electronic band structure of the samples.
G08, GD Naidu Block,
Department of Manufacturing,
Centre of Excellence in Additive Manufacturing,
School of Mechanical Engineering.
Department of Manufacturing,
Centre of Excellence in Additive Manufacturing,
School of Mechanical Engineering.
Dr. Raja Annamalai
Dr. Vasudevan R
G08, GD Naidu Block,
Department of Manufacturing,
Centre of Excellence in Additive Manufacturing,
School of Mechanical Engineering
E-mail: smec.xps@vit.ac.in
Dr. Vasudevan R
G08, GD Naidu Block,
Department of Manufacturing,
Centre of Excellence in Additive Manufacturing,
School of Mechanical Engineering
E-mail: smec.xps@vit.ac.in
| ANALYSIS NAME | UG /PG Students from Academic Institution (in INR) | Research Scholar from Academic Institution (in INR) | Project Staff from Academic Institution (in INR) | Faculty Members from Academic Institution (in INR) | Research Scientist from R&D Organizations (in INR) | Personnel from Industry (in INR) | Personnel from Non - Government Organization (in INR) |
|---|---|---|---|---|---|---|---|
| XPS-Elemental Scan | 750 | 750 | 750 | 750 | 750 | 750 | 750 |
| XPS-Depth Profiling | 1000 | 1000 | 1000 | 1000 | 1000 | 1000 | 1000 |
| XPS-Line Profiling | 1000 | 1000 | 1000 | 1000 | 1000 | 1000 | 1000 |
| XPS-Mapping | 2000 | 2000 | 2000 | 2000 | 2000 | 2000 | 2000 |
| Ultra Violet Photoelectron Spectroscopy | 2000 | 2000 | 2000 | 2000 | 2000 | 2000 | 2000 |
| Low Energy Inverse Photoemission Spectroscopy | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 |