Make: EverBeing Int'l;
Model: C4HT / Keysight B2902B
Probe Station:
- Make: EverBeing Int'l;
- Model: C4HT
- Micropositioners :4 probes with magnetic-lock-based
- Probe:Tungsten tips of 5µm diameter
- Temperatures: RT - 200°C(Heatable vacuum chuck)
- Optical microscope: Magnification: 150x;
- Camera: Moticam 8MP
Source Measurement Unit (SMU) –
- Model:Keysight B2902B
- Voltage range: ±210 V
- Current range:±3 A DC, ±10.5A pulsed
- Accuracy: 0.015%
- Source and measurement
- Resolution : 10 fA and 100 nV
DC Electrical Characterization
Measuring I–V, C–V, and resistance on wafers, dies, or packaged
devices.
RF / High-Frequency Measurements
With RF probes, supports S-parameter, impedance, and signal
Integrity tests.
Temperature-Dependent Testing
With hot chuck (up to ~200 °C), enables study of device behavior
vs. temperature.
Low-Noise / Shielded Measurements
Optional shielding boxes allow probing of ultra-low
Current/voltage devices.
Room No.: 402- Technology Tower,
Device Characterisation Laboratory
Centre for Functional Materials,
Vellore Institute of Technology (VIT), Vellore.
Dr.AnKur Rastogi
402 Technology Tower
Device Characterisation Laboratory
Centre for Functional Materials (CFM),
Vellore Institute of Technology - Vellore Campus,
Thiruvalam Road, Vellore – 632 014, Tamil Nadu, India.
Office Phone: +91 – 416 – 220 2353
Instrument email ID: Yet to receive
S. No.
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Experiment Details
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UG /PG Students from Academic Institutions (in INR)
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Research Scholar from Academic Institution (in INR)
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Project Staff from Academic Institution (in INR)
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Faculty Members from Academic Institutions (in INR)
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Research Scientist from R&D Organizations (in INR)
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Industry Personnel from Industry (in INR)
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1
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Probe Station with Source Meter Unit
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1000
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1000
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1000
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1000
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2000
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2000
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* Charges for per sample in INR (+ applicable GST)