Atomic Force Microscope

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Make: Nanosurf, Switzerland

Model: Nanosurf AFM

  • AFM-Contact mode
  • To study the morphology, roughness and thickness of the coated sample at nm to um level.
  • 3D imaging

The Nanosurf AFM is an easy-to-use instrument that can make nanometer scale resolution measurements of topography and roughness of a sample surface, in contact mode. The Nanosurf AFM is easier to use and takes less time to learn. No alignment or adjustment of the laser is needed, as special tips with an in built alignment system is used. The Nanosurf AFM is ideal to check surface structures, defects.

Room No.: 027
Ground Floor
Technology Tower
Nanotechnology Lab
Centre for Nanotechnology Research

Prof. George Jacob,
Assistant Professor (Sr.),
Centre for Nanotechnology Research,
VIT, Vellore, TN-632014.
Email: cnr.afm@vit.ac.in
Phone: 0416-2202412

User Type Charges (INR) (+ applicable GST)
UG /PG Students from Academic Institution 1000
Research Scholar from Academic Institution 1000
Project Staff from Academic Institution 1000
Faculty Members from Academic Institution 1000
Research Scientist from R&D Organizations 2000
Industry Personnel from Industry 2000
Personnel from Non - Government Organization 2000