Centre for Advanced Research Facility

• Capabilities
  • The Park NX10 is a high-performance, research-grade Atomic Force Microscope (AFM) designed for accurate, user-friendly, and versatile nanoscale imaging and measurement.
  • Key capabilities include flat, orthogonal scanning with minimal bow, low-noise detectors, and specialized True Non-Contact mode.
  • Preserves tip sharpness for superior data, especially on soft or delicate samples.
• 2D Flexure-Guided Scanner with 100 μm x 100 μm Scan Range
  • The XY scanner consists of symmetrical 2-dimensional flexure and high-force piezoelectric stacks.
  • Provides high orthogonal movement with minimal out-of-plane motion.
  • Ensures high responsiveness for precise nanoscale scanning.
  • Compact and rigid structure enables low noise and high-speed servo response.
• High Speed Z Scanner with 15 μm Scan Range
  • Driven by a high-force piezoelectric stack and guided by a flexure structure.
  • High resonant frequency of more than 9 kHz (typically 10.5 kHz).
  • Ultra-fast Z-servo speed of more than 48 mm/sec tip velocity.
  • Z scan range extendable from 15 μm to 30 μm with optional long-range scanner.
• Low Noise XYZ Position Sensors
  • Industry-leading low noise Z detector replaces applied Z voltage as the topography signal.
  • Low noise XY closed-loop scan minimizes forward and backward scan gap to less than 0.15% of the scan range.
• AFM Software
  • Dedicated system control and data acquisition software.
  • Real-time feedback parameter adjustment.
  • Script-level control through external programs (optional).
  • AFM data analysis software (NXI).

• Applications
  • The Z stage and focus stage engage the cantilever with the sample surface while maintaining a clear field of vision for the user.
  • The motorized, software-controlled focus stage provides high precision.
  • Suitable for transparent samples and liquid cell applications.

* Charges are per sample in INR (+ applicable GST)