Make: ULVAC-PHI
Model: VersaProbe 4
- Capabilities
- Elemental Scan (Survey + HR)
- Depth Profiling
- Line Profiling
- Mapping
- Ultraviolet Photoelectron Spectroscopy (UPS)
- Low-Energy Inverse Photoemission Spectroscopy (LEIPS)
- Applications
- Also known as ESCA, it is used to find the surface level elemental composition of the solid samples and the oxidation states of elements present. It can also be used to find the electronic band structure of the samples.
- Charges
| ANALYSIS NAME | UG /PG Students from Academic Institution (in INR) | Research Scholar from Academic Institution (in INR) | Project Staff from Academic Institution (in INR) | Faculty Members from Academic Institution (in INR) | Research Scientist from R&D Organizations (in INR) | Personnel from Industry (in INR) | Personnel from Non – Government Organization (in INR) |
|---|---|---|---|---|---|---|---|
| XPS-Elemental Scan | 2000 | 2000 | 2000 | 2000 | 2000 | 2000 | 2000 |
| XPS-Depth Profiling | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 |
| XPS-Line Profiling | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 |
| XPS-Mapping | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 | 4000 |
| Ultra Violet Photoelectron Spectroscopy | 6000 | 6000 | 6000 | 6000 | 6000 | 6000 | 6000 |
| Low Energy Inverse Photoemission Spectroscopy | 10000 | 10000 | 10000 | 10000 | 10000 | 10000 | 10000 |
- Location
G08, GD Naidu Block,
Department of Manufacturing,
Centre of Excellence in Additive Manufacturing,
School of Mechanical Engineering.
- Contact
Dr. Raja Annamalai
Dr. Vasudevan R
G08, GD Naidu Block,
Department of Manufacturing,
Centre of Excellence in Additive Manufacturing,
School of Mechanical Engineering
E-mail: smec.xps@vit.ac.in