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Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM)

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Make: Atomic Force Microscopy (AFM)

Model: Park Systems NX10, Atomic Force Microscope

  • Specification
  • Superior Imaging Performance.
  • True Non-Contact Mode: Maintains high resolution and prevents tip wear/sample damage by avoiding direct contact during imaging.
  • Low Noise Z-Detector: Features a detector noise floor of 0.02 nm, delivering high-accuracy topography without the need for frequent calibration.
  • Flat XY Scanning: The flexure-guided scanner provides less than 1 nm runout over a 100-micron scan, ensuring negligible background curvature.
  • Capabilities
  • Capabilities
    • The Park NX10 is a high-performance, research-grade Atomic Force Microscope (AFM) designed for accurate, user-friendly, and versatile nanoscale imaging and measurement.
    • Key capabilities include flat, orthogonal scanning with minimal bow, low-noise detectors, and specialized True Non-Contact mode.
    • Preserves tip sharpness for superior data, especially on soft or delicate samples.
  • 2D Flexure-Guided Scanner with 100 μm x 100 μm Scan Range
    • The XY scanner consists of symmetrical 2-dimensional flexure and high-force piezoelectric stacks.
    • Provides high orthogonal movement with minimal out-of-plane motion.
    • Ensures high responsiveness for precise nanoscale scanning.
    • Compact and rigid structure enables low noise and high-speed servo response.
  • High Speed Z Scanner with 15 μm Scan Range
    • Driven by a high-force piezoelectric stack and guided by a flexure structure.
    • High resonant frequency of more than 9 kHz (typically 10.5 kHz).
    • Ultra-fast Z-servo speed of more than 48 mm/sec tip velocity.
    • Z scan range extendable from 15 μm to 30 μm with optional long-range scanner.
  • Low Noise XYZ Position Sensors
    • Industry-leading low noise Z detector replaces applied Z voltage as the topography signal.
    • Low noise XY closed-loop scan minimizes forward and backward scan gap to less than 0.15% of the scan range.
  • AFM Software
    • Dedicated system control and data acquisition software.
    • Real-time feedback parameter adjustment.
    • Script-level control through external programs (optional).
    • AFM data analysis software (NXI).
  • Applications
    • The Z stage and focus stage engage the cantilever with the sample surface while maintaining a clear field of vision for the user.
    • The motorized, software-controlled focus stage provides high precision.
    • Suitable for transparent samples and liquid cell applications.
  • Charges
S. No. Experiment Details UG / PG Students (INR) Research Scholar (INR) Project Staff (INR) Faculty Members (INR) Research Scientist (INR) Industry Personnel (INR)
1 Non-Contact Mode (Solid/Thin film) 2500 2500 2500 2500 4000 4000

* Charges are per sample in INR (+ applicable GST)

  • Location

Room No.: 243 PRP ‘A’ Block
VIT’s Centre for Advanced Research Facility and Testing (VCART)
Vellore Institute of Technology (VIT), Vellore.

  • Contact
Dr. Annamalai Senthil Kumar, CChem., FRSC
Coordinator, VIT’s Centre for Advanced Research Facility and Testing (VCART)
Vellore Institute of Technology, Vellore-632014, Tamil Nadu
Email: vcart@vit.ac.in

List of Instruments in

Centre for Advanced Research Facility (VCART)