Atomic Force Microscopy (AFM)
Make: Atomic Force Microscopy (AFM) Model: Park Systems NX10, Atomic Force Microscope Specification Superior Imaging Performance. True Non-Contact Mode: Maintains high resolution and prevents tip wear/sample damage by avoiding direct contact during imaging. Low Noise Z-Detector: Features a detector noise floor of 0.02 nm, delivering high-accuracy topography without the need for frequent calibration. Flat XY […]